Multifunction Test Instrument Probe

US 8,922,196, assigned to Paul Nicholas Chait, relates to semiconductor and packaging technology, and is available for sale through IPApproach.

US Patents
1 granted
Assignee
Paul Nicholas Chait
Availability
For Sale

Patents Included

Technology Highlights

  • Versatile Testing Capabilities – Integrates multiple functions into a single probe, reducing the need for separate tools.
  • Enhanced Precision – Features a clamp plunger and point plunger, allowing for secure connections and accurate measurements.
  • User-Friendly Design – Incorporates an alligator clamp with spring-loaded jaws, ensuring ease of use in various testing environments.
  • Compact & Efficient – Streamlines testing procedures, making it ideal for professionals in electrical engineering and diagnostics.
  • Market Potential – Valuable for industries requiring high-precision electrical testing, including electronics manufacturing, automotive diagnostics, and telecommunications.

Overview

Here are some key advantages:

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Listing updated August 21, 2026

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